Title :
The determination of dielectric properties at near millimetre wavelengths
Author_Institution :
Div. of Electr. Sci., NPL, Teddington, UK
Abstract :
Summary form only given. The author discussed methods used for dielectric measurements on solids at near millimeter wavelengths over a range of temperatures from 4.2 to values in excess of 1500 K. The methods include both resonant and nonresonant techniques, and monochromatic and broadband ones. A comparison in which a number of such techniques were used in a study of the dielectric properties of a group of specimens was discussed.<>
Keywords :
dielectric measurement; microwave measurement; 4.2 to 1500 K; broadband techniques; dielectric properties; monochromatic techniques; near millimetre wavelengths; nonresonant techniques; resonant techniques; solids; Biomedical optical imaging; Dielectric constant; Dielectric materials; Electromagnetic spectrum; Laboratories; Millimeter wave technology; Optical sensors; Radar applications; Radar remote sensing; Solids;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-0730-5
DOI :
10.1109/APS.1992.221411
