• DocumentCode
    3189044
  • Title

    An iterative MPIE formulation for the RCS computation of microstrip patches

  • Author

    Bokhari, S.A. ; Smith, H.K. ; Mosig, J.R. ; Gardiol, F.E.

  • Author_Institution
    Lab. d´Electromagn. et d´Acoust., Ecole Polytech. Federale de Lausanne, Switzerland
  • fYear
    1992
  • fDate
    18-25 June 1992
  • Firstpage
    2250
  • Abstract
    The use of FFT (fast Fourier transform) algorithms for the computation of resonant frequencies of microstrip patches is examined. Ordinarily, such a scheme alone may not be adequate for a precise solution. However, a judicious combination of the mixed potential integral equation (MPIE) formulation and iterative methods at the vector-level provides acceptable answers for particular geometries and for certain far-field quantities of interest. In the example chosen, a rectangular patch was discretized into 14*10 square cells and a 32*32 point FFT was used. A primary advantage of the approach is its simplicity and the very flexible upper limit on the number of the cells that can be handled, arising from the absence of the moment-method matrix. This allows a very convenient treatment of finite ground planes and also of coupled patches of odd geometries. The disadvantages are those inherent in all FFT-based and iterative methods.<>
  • Keywords
    fast Fourier transforms; integral equations; iterative methods; microstrip antennas; radar cross-sections; FFT; MPIE; RCS; coupled patches; fast Fourier transform; finite ground planes; iterative methods; microstrip patches; mixed potential integral equation; rectangular patch; resonant frequencies; Computational efficiency; Current; Fourier transforms; Geometry; Integral equations; Iterative algorithms; Iterative methods; Microstrip; Resonant frequency; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
  • Conference_Location
    Chicago, IL, USA
  • Print_ISBN
    0-7803-0730-5
  • Type

    conf

  • DOI
    10.1109/APS.1992.221412
  • Filename
    221412