DocumentCode
3189256
Title
Coverage of formal properties based on a high-level fault model and functional ATPG
Author
Fummi, Franco ; Pravadelli, Graziano ; Toto, Franco
Author_Institution
Dipt. di Informatica, Universita di Verona, Italy
fYear
2005
fDate
22-25 May 2005
Firstpage
162
Lastpage
167
Abstract
The use of model checking to validate descriptions of digital systems lacks a coverage metrics. If the set of formal properties defined to prove the correctness of the design is incomplete, the verification can lead to a false sense of security. This paper refines, extends, and compares with other symbolic approaches, a methodology to estimate the incompleteness of formal properties, which exploits a high-level fault model and functional ATPG.
Keywords
automatic test pattern generation; fault simulation; formal verification; integrated circuit testing; automatic test pattern generation; coverage metrics; descriptions validation; digital systems; formal properties; functional ATPG; high-level fault model; model checking; Automatic test pattern generation; Digital systems; Explosions; Fault detection; Logic design; Logic devices; Particle measurements; Security; Test pattern generators; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2005. European
Print_ISBN
0-7695-2341-2
Type
conf
DOI
10.1109/ETS.2005.12
Filename
1430025
Link To Document