• DocumentCode
    3189256
  • Title

    Coverage of formal properties based on a high-level fault model and functional ATPG

  • Author

    Fummi, Franco ; Pravadelli, Graziano ; Toto, Franco

  • Author_Institution
    Dipt. di Informatica, Universita di Verona, Italy
  • fYear
    2005
  • fDate
    22-25 May 2005
  • Firstpage
    162
  • Lastpage
    167
  • Abstract
    The use of model checking to validate descriptions of digital systems lacks a coverage metrics. If the set of formal properties defined to prove the correctness of the design is incomplete, the verification can lead to a false sense of security. This paper refines, extends, and compares with other symbolic approaches, a methodology to estimate the incompleteness of formal properties, which exploits a high-level fault model and functional ATPG.
  • Keywords
    automatic test pattern generation; fault simulation; formal verification; integrated circuit testing; automatic test pattern generation; coverage metrics; descriptions validation; digital systems; formal properties; functional ATPG; high-level fault model; model checking; Automatic test pattern generation; Digital systems; Explosions; Fault detection; Logic design; Logic devices; Particle measurements; Security; Test pattern generators; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2005. European
  • Print_ISBN
    0-7695-2341-2
  • Type

    conf

  • DOI
    10.1109/ETS.2005.12
  • Filename
    1430025