• DocumentCode
    3189318
  • Title

    Convolutional compaction-driven diagnosis of scan failures

  • Author

    Mrugalski, Grzegorz ; Pogiel, Artur ; Rajski, Janusz ; Tyszer, Jerzy ; Wang, Chen

  • Author_Institution
    Mentor Graphics Corp., Wilsonville, OR, USA
  • fYear
    2005
  • fDate
    22-25 May 2005
  • Firstpage
    176
  • Lastpage
    181
  • Abstract
    This paper describes a fault diagnosis technique for scan-based designs with convolutional test response compaction. The proposed approach allows a time-efficient and accurate identification of failing scan cells using Gauss Jordan elimination method.
  • Keywords
    boundary scan testing; built-in self test; fault simulation; integrated circuit testing; Gauss Jordan elimination method; convolutional test response compaction; failing scan cells; fault diagnosis; scan failures; scan-based designs; Compaction; Design for testability; Fault diagnosis; Flip-flops; Gaussian processes; Graphics; Hardware; Integrated circuit testing; Polynomials; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2005. European
  • Print_ISBN
    0-7695-2341-2
  • Type

    conf

  • DOI
    10.1109/ETS.2005.11
  • Filename
    1430027
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3189318