Stuck-open fault diagnosis with stuck-at model

While most of the fault diagnosis tools are based on gate level fault models, many faults are actually at the transistor level. The stuck-open fault is one of them. In this paper we introduce a stuck-open fault diagnosis method based on the stuck-at fault model. First we investigate how stuck-open faults show in the stuck-at diagnosis. Based on the stuck-at diagnosis result, a transformation method is used to represent stuck-open faults. This method transforms the transistor level circuit description to a gate level description so that the stuck-open faults can be diagnosed directly by any of the stuck-at fault diagnosis tools. After the transformation, all the stuck-open faults are fully diagnosed by FALOC, a gate level fault diagnosis tool from Philips.