Title :
The anatomy of nanometer timing failures
Author :
Hawkins, Chuck ; Segura, Jaume
Author_Institution :
New Mexico Univ., Albuquerque, NM, USA
Abstract :
Timing failures have been with CMOS ICs forever. Initially, timing failures were comparatively minor, but are now are a plague in many products. This article summarizes the timing properties of the subcircuits that together affect overall timing performance. We then discuss the subtleties of real failures. Test engineers must understand the design issues to deal with IC timing failures.
Keywords :
CMOS integrated circuits; integrated circuit testing; logic testing; nanotechnology; CMOS integrated circuit; IC timing failures; nanometer timing failures; timing performance; timing properties; Anatomy; Clocks; Combinational circuits; Flip-flops; Frequency; Latches; Logic; Propagation delay; Registers; Timing;
Conference_Titel :
Test Symposium, 2005. European
Print_ISBN :
0-7695-2341-2
DOI :
10.1109/ETS.2005.42
