E-plane performance of two-dimensional strip-element phased arrays with inhomogeneous substrates

The finite-element method of lines is examined as a versatile numerical tool for the analysis of infinite planar arrays. The two-dimensional formulation presented is distinguished by the fact that it allows for finite conductivity of the metal structures, strip thickness, and inhomogeneous dielectric substrates. The numerical solution is used to investigate the E-plane scanning performance of arrays with inhomogeneous substrates, for the purpose of alleviating or eliminating scan blindness problems. A simple example of such an array is one in which the individual strip elements are supported by dielectric slabs of finite extent. The influence on the array characteristics of the finite metallization conductivity and strip thickness is also assessed.<>