Title :
Experimental Evaluation of Transient Effects on SRAM-based FPGA Chips
Author :
Bakhoda, Ali ; Miremadi, Seyed Ghassem ; Zarandi, Hamid R.
Author_Institution :
Dependable Systems Laboratory Department of Computer Engineering Sharif University of Technology Azadi Ave., Tehran, Iran bakhoda@ce.sharif.edu
Abstract :
This paper presents an experimental evaluation of transient effects on SRAM-based FPGAs. A total of 9000 transient faults were injected into the target FPGA using Power Supply Disturbances (PSD). The results show that nearly 60 percent of faults cause system failures and about 58 percent of the faults lead to corruption of the configuration data of the FPGA chip.
Keywords :
Physical Fault Injection; Power Supply Disturbances; SRAM-Based FPGA; Transient Faults; Aerospace industry; Circuit faults; Electricity supply industry; Field programmable gate arrays; Laboratories; Power engineering and energy; Power supplies; Registers; Table lookup; Time to market; Physical Fault Injection; Power Supply Disturbances; SRAM-Based FPGA; Transient Faults;
Conference_Titel :
Microelectronics, 2005. ICM 2005. The 17th International Conference on
Print_ISBN :
0-7803-9262-0
DOI :
10.1109/ICM.2005.1590078
