DocumentCode :
3189550
Title :
PLC advanced technology demonstrator TestChipB
Author :
Vaida, Theodore
Author_Institution :
LSI Logic Corp., Boulder, CO, USA
fYear :
2001
fDate :
2001
Firstpage :
67
Lastpage :
70
Abstract :
Rising complexity in ASIC Systems-On-Chip (SOC) has changed the nature of ASIC design and created a tremendous gap between the manufacturing capability and the engineering capability of ASIC designers and users. To solve this, LSI Logic has licensed the Programmable Logic Core (PLC) architecture developed by Adaptive Silicon Inc. This technology will allow ASIC designers to move some portions of the design later in the cycle, even as late as post tape-out. It will also allow for field reprogrammability. A simple test-chip TestChipA containing only the PLC was produced to verify the basic operation of the architecture. This device showed us that the architecture could be produced on an LSI process, but only exposed the physical design portions of the technology to testing. The next step is to develop a complete SOC device utilizing the PLC. This would enable us to rigorously test the methodologies, comb through the documentation and train our engineers to deliver a fully developed and well supported product. This paper describes the PLC architecture as well as the design methodologies needed to develop the test chip named TestChipB
Keywords :
CMOS integrated circuits; VLSI; application specific integrated circuits; integrated circuit design; logic design; microprocessor chips; programmable logic arrays; ASIC SoC; ASIC design; Adaptive Silicon Inc; LSI Logic; PLC advanced technology demonstrator; TestChipB; field reprogrammability; programmable logic core architecture; systems-on-a-chip; testing; Application specific integrated circuits; Design engineering; Documentation; Large scale integration; Manufacturing; Programmable control; Programmable logic arrays; Programmable logic devices; Silicon; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits, 2001, IEEE Conference on.
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-6591-7
Type :
conf
DOI :
10.1109/CICC.2001.929725
Filename :
929725
Link To Document :
بازگشت