Title : 
Design challenges for ultra-wideband wireless communications within a computer chassis
         
        
            Author : 
Hu, Changhui ; Xia, Lingli ; Redfield, Stephen ; Woracheewan, Sirikarn ; Khanna, Rahul ; Nejedlo, Jay ; Liu, Huaping ; Chiang, Patrick Y.
         
        
            Author_Institution : 
Oregon State Univ., Corvallis, OR, USA
         
        
        
            fDate : 
Nov. 30 2011-Dec. 2 2011
         
        
        
        
            Abstract : 
Conventional metal wiring is becoming an inevitable difficulty for a computing platform. This paper presents an Ultrawideband (UWB) wireless interconnection solution. The channel characteristics within a computer chassis is analyzed, including the path loss, multipath reflections and electromagnetic interferences (EMI). To address the above problems, an IR-UWB transceiver is proposed with equalization in transmitter to relax the multipath reflections and pulse injection-locking for receiver clock recovery and synchronization. The transceiver achieved a significant power saving for high data rate (up to 500Mbps) demodulation.
         
        
            Keywords : 
demodulation; electromagnetic interference; radio transceivers; ultra wideband communication; wiring; IR-UWB transceiver; channel characteristics; computer chassis; demodulation; design challenge; electromagnetic interference; metal wiring; multipath reflection; path loss; pulse injection-locking; receiver clock recovery; receiver clock synchronization; transmitter; ultrawideband wireless communication; ultrawideband wireless interconnection solution; Clocks; Computers; Receivers; Synchronization; Transceivers; Transmitters; Wireless communication; EMI; IR-UWB; injection-locking; multipath equalization; synchronization; transceiver;
         
        
        
        
            Conference_Titel : 
Radio-Frequency Integration Technology (RFIT), 2011 IEEE International Symposium on
         
        
            Conference_Location : 
Beijing
         
        
            Print_ISBN : 
978-1-4577-0517-5
         
        
        
            DOI : 
10.1109/RFIT.2011.6141741