Title :
Quantifying The Learning Curve Of A Vision Inspection System
Author :
Naim, M.M. ; Chan, J.P. ; Huneiti, A.M.
Author_Institution :
Cardiff School of Engineering, U. W.C. Cardiff, U.K.
Conference_Titel :
Factory 2000 - Advanced Factory Automation, Fourth International Conference on (Conf. Publ. No. 398)
Conference_Location :
IET
Print_ISBN :
0-85296-626-1
