DocumentCode
3189716
Title
Near infra-red wavelength metrology with semiconductor diode lasers
Author
Pendrill, L.R. ; Carlsson, Oscar ; Andersson-Faldt, A.
Author_Institution
Swedish Nat. Testing & Res. Inst. SP, Boras, Sweden
fYear
1998
fDate
6-10 July 1998
Firstpage
288
Lastpage
289
Abstract
A laser spectral measurement facility has been developed in response to needs for the accurate determination of laser wavelength in the near infrared spectral region in a diversity of applications (fundamental constant determination, optical DWDM communication, environmental spectroscopy, ...). The facility is based on a number of frequency-stabilised grating cavity lasers, atomic and molecular reference cells and optical interferometers.
Keywords
laser variables measurement; light interferometry; measurement by laser beam; semiconductor lasers; atomic reference cell; frequency stabilised grating cavity laser; molecular reference cell; near infrared wavelength metrology; optical interferometer; semiconductor diode laser; spectral measurement; Atom optics; Infrared spectra; Metrology; Optical fiber communication; Optical interferometry; Semiconductor diodes; Semiconductor lasers; Spectroscopy; Wavelength division multiplexing; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location
Washington, DC, USA
Print_ISBN
0-7803-5018-9
Type
conf
DOI
10.1109/CPEM.1998.701545
Filename
701545
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