Stability testing of CdTe/CdS thin-film photovoltaic modules

Author

Powell, R.C. ; Sasala, R. ; Rich, G. ; Steele, M. ; Bihn, K. ; Reiter, N. ; Cox, S. ; Dorer, G.

Author_Institution

Solar Cells Inc., Toledo, OH, USA

fYear

1996

fDate

13-17 May 1996

Firstpage

785

Lastpage

788

Abstract

High efficiency, durability, and long-term stability are critical components of cost-effective photovoltaic modules. Industry-established protocols for testing efficiency and durability such as ASTM E948, E1036, and the Module Qualification Test, are effective in ensuring the initial module performance and the integrity of the encapsulation and mechanical components. However, these protocols do not adequately test long-term module performance. This paper describes the initial development of an accelerated testing methodology utilizing various applied stresses. The results of more than 2 years of indoor testing indicate that stable CdS/CdTe modules can be produced

Keywords

II-VI semiconductors; cadmium compounds; life testing; semiconductor device testing; semiconductor thin films; solar cells; stability; CdTe-CdS; CdTe/CdS thin-film photovoltaic modules; accelerated testing methodology; applied stresses; durability; high efficiency; long-term module performance; long-term stability; stability testing; Encapsulation; Life estimation; Photovoltaic systems; Protocols; Qualifications; Solar power generation; Stability; Stress; Testing; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE

Conference_Location

Washington, DC

ISSN

0160-8371

Print_ISBN

0-7803-3166-4

Type

conf

DOI

10.1109/PVSC.1996.564245

Filename

564245