Title :
Distinction between added-energy and phase-resetting mechanisms in non-invasively detected somatosensory evoked responses
Author :
Fedele, T. ; Scheer, H.-J. ; Burghoff, Martin ; Waterstraat, G. ; Nikulin, Vadim V. ; Curio, Gabriel
Author_Institution :
Dept. of Neurology, Charite-Univ. Med. Berlin, Berlin, Germany
Abstract :
Non-invasively recorded averaged event-related potentials (ERP) represent a convenient opportunity to investigate human brain perceptive and cognitive processes. Nevertheless, generative ERP mechanisms are still debated. Two previous approaches have been contested in the past: the added-energy model in which the response raises independently from the ongoing background activity, and the phase-reset model, based on stimulus-driven synchronization of oscillatory ongoing activity. Many criteria for the distinction of these two models have been proposed, but there is no definitive methodology to disentangle them, owing also to the limited information at the single trial level. Here, we propose a new approach combining low-noise EEG technology and multivariate decomposition techniques. We present theoretical analyses based on simulated data and identify in high-frequency somatosensory evoked responses an optimal target for the distinction between the two mechanisms.
Keywords :
bioelectric potentials; cognition; electroencephalography; somatosensory phenomena; synchronisation; ERP mechanisms; added-energy mechanism; added-energy model; high-frequency somatosensory evoked responses; human brain cognitive process; human brain perceptive process; low-noise EEG technology; multivariate decomposition techniques; noninvasively detected somatosensory evoked responses; noninvasively recorded averaged event-related potentials; phase-reset model; phase-resetting mechanism; stimulus-driven synchronization; Brain modeling; Electroencephalography; Phase frequency detector; Signal to noise ratio; Synchronization;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2013 35th Annual International Conference of the IEEE
Conference_Location :
Osaka
DOI :
10.1109/EMBC.2013.6609843