DocumentCode
3189850
Title
Minimization in Variation of Output Characteristics of a SOI MOS Due to Self Heating
Author
Bansal, Sahil M. ; Nagchaudhuri, D.
Author_Institution
Undergraduate Student Punjab Engineering College Chandigarh, India. sahilm@ieee.org
fYear
2005
fDate
13-15 Dec. 2005
Firstpage
318
Lastpage
321
Abstract
The advantages of SOI MOSFETs over the bulk Silicon transistors are clouded by impact of self-heating on the output characteristics. An attempt has been made to minimize the variation in drain current by studying two different techniques. First, by providing a feedback path comprising Voltage & Current controlled sources. Another novel approach has been discussed which involves making changes in the values of some temperature dependent variables of the SOIMOS such that the variation in the Drain Current values due to effects of change in mobility & threshold voltage values in response to temperature increase neutralize each other.
Keywords
Degradation; Feedback circuits; Feedback loop; Heat engines; Heating; MOSFETs; Silicon on insulator technology; Temperature dependence; Threshold voltage; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, 2005. ICM 2005. The 17th International Conference on
Print_ISBN
0-7803-9262-0
Type
conf
DOI
10.1109/ICM.2005.1590093
Filename
1590093
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