DocumentCode :
3189850
Title :
Minimization in Variation of Output Characteristics of a SOI MOS Due to Self Heating
Author :
Bansal, Sahil M. ; Nagchaudhuri, D.
Author_Institution :
Undergraduate Student Punjab Engineering College Chandigarh, India. sahilm@ieee.org
fYear :
2005
fDate :
13-15 Dec. 2005
Firstpage :
318
Lastpage :
321
Abstract :
The advantages of SOI MOSFETs over the bulk Silicon transistors are clouded by impact of self-heating on the output characteristics. An attempt has been made to minimize the variation in drain current by studying two different techniques. First, by providing a feedback path comprising Voltage & Current controlled sources. Another novel approach has been discussed which involves making changes in the values of some temperature dependent variables of the SOIMOS such that the variation in the Drain Current values due to effects of change in mobility & threshold voltage values in response to temperature increase neutralize each other.
Keywords :
Degradation; Feedback circuits; Feedback loop; Heat engines; Heating; MOSFETs; Silicon on insulator technology; Temperature dependence; Threshold voltage; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2005. ICM 2005. The 17th International Conference on
Print_ISBN :
0-7803-9262-0
Type :
conf
DOI :
10.1109/ICM.2005.1590093
Filename :
1590093
Link To Document :
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