• DocumentCode
    3189850
  • Title

    Minimization in Variation of Output Characteristics of a SOI MOS Due to Self Heating

  • Author

    Bansal, Sahil M. ; Nagchaudhuri, D.

  • Author_Institution
    Undergraduate Student Punjab Engineering College Chandigarh, India. sahilm@ieee.org
  • fYear
    2005
  • fDate
    13-15 Dec. 2005
  • Firstpage
    318
  • Lastpage
    321
  • Abstract
    The advantages of SOI MOSFETs over the bulk Silicon transistors are clouded by impact of self-heating on the output characteristics. An attempt has been made to minimize the variation in drain current by studying two different techniques. First, by providing a feedback path comprising Voltage & Current controlled sources. Another novel approach has been discussed which involves making changes in the values of some temperature dependent variables of the SOIMOS such that the variation in the Drain Current values due to effects of change in mobility & threshold voltage values in response to temperature increase neutralize each other.
  • Keywords
    Degradation; Feedback circuits; Feedback loop; Heat engines; Heating; MOSFETs; Silicon on insulator technology; Temperature dependence; Threshold voltage; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2005. ICM 2005. The 17th International Conference on
  • Print_ISBN
    0-7803-9262-0
  • Type

    conf

  • DOI
    10.1109/ICM.2005.1590093
  • Filename
    1590093