• DocumentCode
    3189890
  • Title

    A 900 MS/s 6b interleaved CMOS flash ADC

  • Author

    Yu, Baiying ; Black, William C., Jr.

  • Author_Institution
    Analog & Mixed-Signal Design Center, Iowa State Univ., Ames, IA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    149
  • Lastpage
    152
  • Abstract
    A 900 MS/s, 6 bit, 4-way, time-interleaved flash ADC is demonstrated. The 4 on-chip ADCs share a common reference string and preamplifiers to minimize the mismatch between channels. The measured SNDR is over 31 dB at 900 MHz with analog input at 1.1 MHz. The chip has been fabricated in a standard 0.25 μm CMOS process and occupies an active area of 2.08 mm2
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; error analysis; high-speed integrated circuits; 0.25 micron; 1.1 MHz; 31 dB; 4-way configuration; 6 bit; 900 MHz; common preamplifiers; common reference string; interleaved CMOS flash ADC; time-interleaved A/D convertor; CMOS process; Clocks; Degradation; Frequency estimation; Performance gain; Preamplifiers; Sampling methods; Semiconductor device measurement; Signal to noise ratio; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits, 2001, IEEE Conference on.
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-6591-7
  • Type

    conf

  • DOI
    10.1109/CICC.2001.929744
  • Filename
    929744