• DocumentCode
    3189900
  • Title

    Analyzing of Phase Noise in CMOS LC Oscillators

  • Author

    Saeidi, R. ; Masoumi, N. ; Kalantari, F. ; Oskooei, M.S.

  • Author_Institution
    VLSI Research Group, University of Tehran
  • fYear
    2005
  • fDate
    13-15 Dec. 2005
  • Firstpage
    330
  • Lastpage
    337
  • Abstract
    Analyses of phase noise in differential cross coupled inductance-capacitance (LC) oscillators and single-ended Colpitts oscillators are presented. Various noise sources in these oscillators are identified, and then their effects on phase noise are analyzed. To simulate the Impulse Sensitivity and Noise Modulation Factor waveforms of the above mentioned oscillators, the direct impulse response measurement method of is implemented in HSpice. We simulated two different oscillators, using the same tank inductance and are tuned to oscillate at the center frequency of 1.8 GHz with a voltage source of 1.8 V in 0.18 RF CMOS process. The inductors have a quality factor of 5 at 1.8 GHz and operate in the current limited regime.
  • Keywords
    Noise measurement; oscillator noise; phase noise; phase-locked loops; voltage-controlled oscillators; Active noise reduction; Circuit topology; Integrated circuit noise; Noise generators; Noise measurement; Phase noise; Q factor; Radio frequency; Very large scale integration; Voltage-controlled oscillators; Noise measurement; oscillator noise; phase noise; phase-locked loops; voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2005. ICM 2005. The 17th International Conference on
  • Print_ISBN
    0-7803-9262-0
  • Type

    conf

  • DOI
    10.1109/ICM.2005.1590096
  • Filename
    1590096