DocumentCode
3189932
Title
Fast 2D to 3D conversion based on wavelet analysis
Author
Chiang, Te-Wei ; Tsai, Tienwei ; Lin, Yu-Hong ; Hsiao, Mann-Jung
Author_Institution
Dept. of Accounting Inf. Syst., Chihlee Inst. of Technol., Banciao, Taiwan
fYear
2010
fDate
10-13 Oct. 2010
Firstpage
3444
Lastpage
3448
Abstract
This paper proposes a depth estimation method which converts two-dimensional images of limited depth of field (DOF) into three-dimensional data. The goal is to separate the focused foreground objects from the blurred background objects in an image. Our approach is based on two observations: (1) the focused objects on an image of limited DOF correspond to the objects with high frequency; (2) the high-frequency area of an image appears high energy on its high-frequency wavelet subbands. In our approach, each image is first transformed to the YUV color space; then Y component of the image is further transformed to the wavelet domain. Afterwards, the high-frequency area of an image can be obtained from analyzing the high-frequency wavelet subbands of the image. Finally, binarization and smoothing techniques are applied to find the position of the focused objects on the image. The experimental result demonstrates the effectiveness of our approach.
Keywords
image processing; wavelet transforms; YUV color space; binarization technique; blurred background objects; depth estimation method; depth of field; fast 2D-to-3D image conversion; high-frequency wavelet subbands; smoothing technique; wavelet analysis; Image color analysis; Image edge detection; Smoothing methods; 2D to 3D conversion; depth map; wavelet;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems Man and Cybernetics (SMC), 2010 IEEE International Conference on
Conference_Location
Istanbul
ISSN
1062-922X
Print_ISBN
978-1-4244-6586-6
Type
conf
DOI
10.1109/ICSMC.2010.5642454
Filename
5642454
Link To Document