• DocumentCode
    3189932
  • Title

    Fast 2D to 3D conversion based on wavelet analysis

  • Author

    Chiang, Te-Wei ; Tsai, Tienwei ; Lin, Yu-Hong ; Hsiao, Mann-Jung

  • Author_Institution
    Dept. of Accounting Inf. Syst., Chihlee Inst. of Technol., Banciao, Taiwan
  • fYear
    2010
  • fDate
    10-13 Oct. 2010
  • Firstpage
    3444
  • Lastpage
    3448
  • Abstract
    This paper proposes a depth estimation method which converts two-dimensional images of limited depth of field (DOF) into three-dimensional data. The goal is to separate the focused foreground objects from the blurred background objects in an image. Our approach is based on two observations: (1) the focused objects on an image of limited DOF correspond to the objects with high frequency; (2) the high-frequency area of an image appears high energy on its high-frequency wavelet subbands. In our approach, each image is first transformed to the YUV color space; then Y component of the image is further transformed to the wavelet domain. Afterwards, the high-frequency area of an image can be obtained from analyzing the high-frequency wavelet subbands of the image. Finally, binarization and smoothing techniques are applied to find the position of the focused objects on the image. The experimental result demonstrates the effectiveness of our approach.
  • Keywords
    image processing; wavelet transforms; YUV color space; binarization technique; blurred background objects; depth estimation method; depth of field; fast 2D-to-3D image conversion; high-frequency wavelet subbands; smoothing technique; wavelet analysis; Image color analysis; Image edge detection; Smoothing methods; 2D to 3D conversion; depth map; wavelet;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems Man and Cybernetics (SMC), 2010 IEEE International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1062-922X
  • Print_ISBN
    978-1-4244-6586-6
  • Type

    conf

  • DOI
    10.1109/ICSMC.2010.5642454
  • Filename
    5642454