DocumentCode :
3189988
Title :
Melting and Cavity Growth in the Vicinity of Crack Tips Subjected to Short-Duration Current Pulses
Author :
Gallo, F. ; Satapathy, S. ; Chandar, K. Ravi
Author_Institution :
Univ. of Texas, Austin, TX
fYear :
2008
fDate :
10-13 June 2008
Firstpage :
1
Lastpage :
3
Abstract :
The current-carrying conductors in an electromagnetic launcher are exposed to high currents that last for a few milliseconds. Surface cracks on the rails can generate large gradients in current in their vicinity and may result, in some instances, in localized melting and expulsion of rail material. Here, we report the results of a study in which the mechanical and electrical parameters of the process were monitored as a function of time and the evolution of melting and ejection was examined through high-speed photography.
Keywords :
electromagnetic launchers; melting; surface cracks; wear; cavity growth; crack tips; current-carrying conductors; electromagnetic launcher; melting; short-duration current pulses; surface cracks; Condition monitoring; Conducting materials; Geometry; Photography; Rails; Signal processing; Stress; Surface cracks; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Launch Technology, 2008 14th Symposium on
Conference_Location :
Victoria, BC
Print_ISBN :
978-1-4244-1832-9
Electronic_ISBN :
978-1-4244-1833-6
Type :
conf
DOI :
10.1109/ELT.2008.121
Filename :
4657681
Link To Document :
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