Title :
R(f)L(f)C coupled noise evaluation of an S/390 microprocessor chip
Author :
Smith, H. ; Deutsch, A. ; Mehrotra, S. ; Widiger, D. ; Bowen, M. ; Dansky, A. ; Kopcsay, G. ; Krauter, B.
Author_Institution :
S/390 Dev. Lab., IBM Corp., Poughkeepsie, NY, USA
Abstract :
A coupling noise evaluation of a high performance S/390 microprocessor using a full chip RLC extraction and simulation process is presented. Review of on-chip wiring guidelines with respect to the inaccuracies of an RC coupling evaluation for known net topologies is discussed in terms of tool requirements for full-chip noise evaluation which include inductive coupling effects. The extraction and simulation approach is described in terms of algorithms and procedures used to account for the frequency dependent RLC effects in a manner that allow a full chip noise evaluation. Results are presented which compare noise amplitude differences between RC and R(f)L(f)C evaluations for the wiring data of an S/390 microprocessor as well as pertinent statistics such as run times and memory usage
Keywords :
circuit simulation; equivalent circuits; integrated circuit modelling; integrated circuit noise; microprocessor chips; RLC coupled noise evaluation; S/390 microprocessor chip; frequency dependent RLC effects; full chip RLC extraction process; full chip RLC simulation process; high performance microprocessor; inductive coupling effects; net topologies; noise amplitude differences; onchip wiring guidelines; Circuit noise; Coupling circuits; Equations; Integrated circuit interconnections; Microprocessor chips; Noise level; RLC circuits; Topology; Wire; Wiring;
Conference_Titel :
Custom Integrated Circuits, 2001, IEEE Conference on.
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-6591-7
DOI :
10.1109/CICC.2001.929763
