DocumentCode :
3190224
Title :
Demonstration of entangled-photon ellipsometry
Author :
Sergienko, Alexander V. ; Toussaint, Kimani C., Jr. ; Di Giuseppe, Giovanni ; Saleh, Bahaa E A ; Teich, Malvin C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Boston Univ., MA, USA
fYear :
2003
fDate :
22-27 June 2003
Firstpage :
339
Abstract :
We report on experimental demonstration of entangled-photon quantum ellipsometry using semiconductor samples.
Keywords :
III-V semiconductors; ellipsometry; gallium arsenide; quantum entanglement; quantum optics; GaAs; entangled-photon ellipsometry; semiconductor samples; Detectors; Ellipsometry; Gallium arsenide; Laser excitation; Nonlinear optics; Optical films; Optical interferometry; Optical polarization; Optical pumping; Optimized production technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics Conference, 2003. EQEC '03. European
Print_ISBN :
0-7803-7733-8
Type :
conf
DOI :
10.1109/EQEC.2003.1314196
Filename :
1314196
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3190224
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