Title :
A fast method for identifying matching-relevant transistor pairs
Author :
Schenkel, E. ; Pronath, M. ; Graeb, H. ; Antreich, K.
Author_Institution :
Inst. for Electron. Design Autom., Tech. Univ. of Munich, Germany
Abstract :
This paper presents a new method to identify mismatch-relevant transistor pairs at the circuit level. It consists in a two-stage selection process that is derived from a sensitivity-based formulation of matching relevancy and is thus very fast. The presented results show the efficiency and effectiveness of the method
Keywords :
analogue integrated circuits; identification; integrated circuit design; sensitivity analysis; analog circuit design; circuit level; fast method; matching relevancy; matching-relevant transistor pairs identification; sensitivity-based formulation; two-stage selection process; Analog circuits; Automotive engineering; Circuit synthesis; Circuit topology; Electronic design automation and methodology; Electronics industry; Mirrors; System-on-a-chip; Threshold voltage; Transistors;
Conference_Titel :
Custom Integrated Circuits, 2001, IEEE Conference on.
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-6591-7
DOI :
10.1109/CICC.2001.929802
