Title :
3-D FDTD image analysis in transmission illumination mode of scanning near-field optical microscopy
Author :
Vasilyeva, E. ; Taflove, A.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL, USA
Abstract :
Tunnel scanning near-field optical microscopy (tunnel SNOM or TNOM) detects not only the regularly transmitted waves but also radiation coupled via evanescent waves to the classically forbidden directions (angles larger than the angle of total internal reflection). Forbidden light can, in general, provide images with higher contrast and resolution than those of allowed-light images. However, the full use of the forbidden-light information requires better understanding of the SNOM imaging process. While the multiple multipole method (MMP) has been proven to be useful for 2-D modeling of SNOM, it seems to be unsuitable for more realistic 3-D simulations due to difficulties in dealing with complicated inhomogeneous material geometries.
Keywords :
finite difference time-domain analysis; image resolution; inhomogeneous media; near-field scanning optical microscopy; 3D FDTD image analysis; 3D simulations; allowed-light images; evanescent waves; forbidden-light information; image contrast; image resolution; inhomogeneous material geometries; multiple multipole method; radiation; scanning near-field optical microscopy; total internal reflection angle; transmission illumination mode; transmitted waves; Finite difference methods; Image analysis; Lighting; Near-field radiation pattern; Optical coupling; Optical microscopy; Optical surface waves; Radiation detectors; Solid modeling; Time domain analysis;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1998. IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-4478-2
DOI :
10.1109/APS.1998.701551
