DocumentCode :
3190670
Title :
Detection of scale-invariant key points employing a resistive network
Author :
Yasukawa, Shodai ; Okuno, Hirotsugu ; Yagi, Takeshi
Author_Institution :
Div. of Electr., Electron. & Inf. Eng., Osaka Univ., Suita, Japan
fYear :
2012
fDate :
16-18 Dec. 2012
Firstpage :
877
Lastpage :
882
Abstract :
We assessed the feasibility of applying a resistive network (RN) filter to the scale-invariant feature transform (SIFT) algorithm by performing computer simulations for the hardware implementation of the filter. SIFT is an algorithm for computer vision to describe and detect local features that are invariant to scale and rotation of objects. However, it is difficult to perform multiple spatial filterings in SIFT algorithm in real time due to its high computational cost. To solve this problem, we employed an RN which performs spatial filtering instantaneously with extremely low power dissipation. In order to apply an RN filter to the SIFT algorithm instead of Gaussian filter, which is employed in the original SIFT algorithm, we investigated the difference in the spatial properties of the two filters. We simulated the SIFT algorithm employing the RN filter on a computer, and we demonstrated that key points were detected at the same place irrespective of the image size, and that the scale of the key point was detected appropriately.
Keywords :
Gaussian processes; computer vision; filtering theory; object detection; object recognition; transforms; Gaussian filter; RN filter; SIFT algorithm; computer simulations; computer vision; local features; object detection; object recognition; resistive network filter; scale-invariant feature transform algorithm; scale-invariant key points; spatial filterings; Computational efficiency; Educational institutions; Feature extraction; Filtering algorithms; Histograms; Power dissipation; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
System Integration (SII), 2012 IEEE/SICE International Symposium on
Conference_Location :
Fukuoka
Print_ISBN :
978-1-4673-1496-1
Type :
conf
DOI :
10.1109/SII.2012.6427366
Filename :
6427366
Link To Document :
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