Title :
Defect chalcopyrite Cu(In1-xGax)3Se5 materials and high Ga-content Cu(In,Ga)Se2-based solar cells
Author :
Contreras, Miguel A. ; Wiesner, H. ; Niles, D. ; Ramanathan, K. ; Matson, R. ; Tuttle, J. ; Keane, J. ; Noufi, R.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
Abstract :
Crystallographic, optical, and electrical properties of defect chalcopyrite Cu(In1-xGa)3Se5 (0<x<1) materials in polycrystalline thin-film form are reported. Also, an energy band alignment between such materials and CdS has been calculated from X-ray photoelectron spectroscopy data. A comparison of some properties against published data on similarly prepared chalcopyrite CuIn1-xGaxSe2 absorber materials is presented. Considering the chalcopyrite/defect chalcopyrite junction model, we postulate that the traditionally poor device performance of uniform high-Ga-content absorbers (x>0.3) is due to a relatively inferior character-both structural and electrical-at the very chalcopyrite/defect chalcopyrite interface. We demonstrate that this situation can be circumvented (for absorbers with x>0.3) by properly engineering such an interface by reducing Ga content in the region near the surface of the absorber
Keywords :
X-ray photoelectron spectra; X-ray spectroscopy; band structure; copper compounds; crystal defects; gallium compounds; indium compounds; optical properties; semiconductor thin films; solar cells; ternary semiconductors; CdS; Cu(InGa)3Se5; Cu(InGa)Se2; X-ray photoelectron spectroscopy; absorber materials; chalcopyrite/defect chalcopyrite junction model; crystallographic properties; defect chalcopyrite Cu(In1-xGax)3Se5 materials; electrical properties; energy band alignment; high Ga-content Cu(In,Ga)Se2; optical properties; polycrystalline thin-film form; solar cells; Atomic measurements; Composite materials; Conducting materials; Conductivity; Lattices; Optical materials; Photonic band gap; Software standards; Thermal stresses; X-ray scattering;
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3166-4
DOI :
10.1109/PVSC.1996.564251