• DocumentCode
    3190734
  • Title

    Defect chalcopyrite Cu(In1-xGax)3Se5 materials and high Ga-content Cu(In,Ga)Se2-based solar cells

  • Author

    Contreras, Miguel A. ; Wiesner, H. ; Niles, D. ; Ramanathan, K. ; Matson, R. ; Tuttle, J. ; Keane, J. ; Noufi, R.

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    1996
  • fDate
    13-17 May 1996
  • Firstpage
    809
  • Lastpage
    812
  • Abstract
    Crystallographic, optical, and electrical properties of defect chalcopyrite Cu(In1-xGa)3Se5 (0<x<1) materials in polycrystalline thin-film form are reported. Also, an energy band alignment between such materials and CdS has been calculated from X-ray photoelectron spectroscopy data. A comparison of some properties against published data on similarly prepared chalcopyrite CuIn1-xGaxSe2 absorber materials is presented. Considering the chalcopyrite/defect chalcopyrite junction model, we postulate that the traditionally poor device performance of uniform high-Ga-content absorbers (x>0.3) is due to a relatively inferior character-both structural and electrical-at the very chalcopyrite/defect chalcopyrite interface. We demonstrate that this situation can be circumvented (for absorbers with x>0.3) by properly engineering such an interface by reducing Ga content in the region near the surface of the absorber
  • Keywords
    X-ray photoelectron spectra; X-ray spectroscopy; band structure; copper compounds; crystal defects; gallium compounds; indium compounds; optical properties; semiconductor thin films; solar cells; ternary semiconductors; CdS; Cu(InGa)3Se5; Cu(InGa)Se2; X-ray photoelectron spectroscopy; absorber materials; chalcopyrite/defect chalcopyrite junction model; crystallographic properties; defect chalcopyrite Cu(In1-xGax)3Se5 materials; electrical properties; energy band alignment; high Ga-content Cu(In,Ga)Se2; optical properties; polycrystalline thin-film form; solar cells; Atomic measurements; Composite materials; Conducting materials; Conductivity; Lattices; Optical materials; Photonic band gap; Software standards; Thermal stresses; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3166-4
  • Type

    conf

  • DOI
    10.1109/PVSC.1996.564251
  • Filename
    564251