Title :
A study of reduced-terminal models for system-level SSO noise analysis
Author :
Ha, Myunghyun ; Kim, Joong-Ho ; Oh, Dan ; Swaminathan, Madhavan
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
SSO noise modeling imposes significant challenges in signal integrity analysis as it requires a complex model which represents numerous signal, power, and ground conductors and planes. Even with effective macros modeling techniques, the resulting model is still complex due to a large number of external nodes which often represent data, power, and ground pins or pads. This paper discusses several options to reduce the number of external nodes for SSO simulation. Both signal and power nodes are reduced based on the worst case aggressor switching activities. Significance of placing supernode in reduction of signal nodes is discussed. Low power memory system is considered as a numerical example to demonstrate and compare the accuracy of each option.
Keywords :
interference suppression; signal processing; low power memory system; reduced-terminal model; signal integrity analysis; system-level SSO noise analysis; Complexity theory; Data models; Driver circuits; Integrated circuit modeling; Noise; Silicon; Solid modeling; SSO analysis; model reduction; power integrity; signal intergrity; worst case analysis;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2010 IEEE 19th Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-6865-2
Electronic_ISBN :
978-1-4244-6866-9
DOI :
10.1109/EPEPS.2010.5642541