DocumentCode
3191067
Title
An automated UTD approach for modeling wave propagation over hilly terrain based on digital maps
Author
Chang-Fa Yang ; Wen-Yao Chang ; Wen-Yao Hwu ; Hsueh-Jyh Li
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Inst. of Technol., Taipei, Taiwan
Volume
4
fYear
1998
fDate
21-26 June 1998
Firstpage
1880
Abstract
Simulation methods for predicting wave propagation over irregular terrain in the frequency ranges of VHF, UHF, and microwaves have been studied by many investigators. Those methods were applied to evaluate propagation path losses, coverage predictions, spectrum management, low altitude radar performance, microwave landing systems, etc. UTD ray models with digital terrain data simplified to two-dimensional (2-D) piecewise-linear profiles of wedges have been employed successfully to site-specifically determine terrain wave propagation. This article presents an automated method to simplify raw digital hilly terrain profiles into 2-D straight wedges and trapezoids (two consecutive wedges) based directly on the variations of the terrain elevations along a given vertical Tx-Rx profile. Also, a UTD ray approach for calculating all the forward diffraction from those piecewise-linear 2-D structures is proposed.
Keywords
digital simulation; electromagnetic wave scattering; geometrical theory of diffraction; losses; radiowave propagation; 2D piecewise-linear profiles; 2D straight wedges; UHF; UTD ray models; VHF; automated UTD; coverage predictions; digital maps; forward diffraction; forward scattering; hilly terrain; low altitude radar performance; microwave landing systems; microwaves; propagation path losses; simulation methods; spectrum management; terrain elevations; trapezoids; wave propagation modeling; Frequency; Microwave propagation; Microwave theory and techniques; Performance loss; Piecewise linear techniques; Predictive models; Propagation losses; Radar; Radio spectrum management; UHF propagation;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1998. IEEE
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-4478-2
Type
conf
DOI
10.1109/APS.1998.701570
Filename
701570
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