Title :
Factors affecting the calculation of effective conductivity in printed circuit boards [thermal analysis]
Author :
Culham, J. Richard ; Yovanovich, M. Michael
Author_Institution :
Dept. of Mech. Eng., Waterloo Univ., Ont., Canada
Abstract :
A comparative study is presented that demonstrates the importance of including both the material resistance and the spreading resistance in the calculation of effective thermal conductivity for printed circuit board applications. An analytically based Fourier series model is used to calculate effective conductivity in three dimensional test coupons. Results show that models based exclusively on cross-plane and in-plane resistive networks are not adequate for predicting effective conductivity in multilayer laminated printed circuit boards. The mixed boundary conditions found in most microelectronics applications accentuate the importance of spreading resistance between heat sources and the convective boundaries. Discrepancies between commonly used methods of calculating effective conductivity and methods incorporating both the bulk material and spreading resistance can be greater than 100% for geometries typically found in microelectronics applications
Keywords :
Fourier analysis; Fourier series; convection; printed circuit testing; printed circuits; thermal analysis; thermal conductivity; thermal resistance; 3D test coupons; analytically based Fourier series model; bulk material thermal resistance; convective boundaries; cross-plane resistive network models; effective conductivity; effective thermal conductivity; heat sources; in-plane resistive network models; material thermal resistance; microelectronics applications; mixed boundary conditions; multilayer laminated printed circuit boards; printed circuit boards; spreading resistance; spreading thermal resistance; thermal analysis; Boundary conditions; Circuit testing; Conducting materials; Fourier series; Microelectronics; Nonhomogeneous media; Predictive models; Printed circuits; Thermal conductivity; Thermal resistance;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 1998. ITHERM '98. The Sixth Intersociety Conference on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-4475-8
DOI :
10.1109/ITHERM.1998.689603