• DocumentCode
    3191297
  • Title

    Can a sequential thinning algorithm be parallelized?

  • Author

    Acierno, A. D´ ; De Stefano, C. ; Tortorella, F. ; Vento, M.

  • Author_Institution
    IRSIP, CNR, Naples, Italy
  • fYear
    1994
  • fDate
    9-13 Oct 1994
  • Firstpage
    360
  • Abstract
    It is commonly presumed that only parallel thinning algorithms can be efficiently implemented on a parallel machine. In this paper it is shown that also a sequential thinning algorithm can have parallel features which can be made explicit and successfully used for a parallel implementation. To this end, the main phases of a fully sequential algorithm are reformulated in such a way that each phase can be carried out by using parallel operators. Experimental results, obtained on a general purpose SIMD machine, are finally discussed
  • Keywords
    image recognition; general-purpose SIMD machine; parallel thinning algorithms; sequential thinning algorithm; Application software; Computed tomography; Computer architecture; Computer vision; Concurrent computing; Labeling; Parallel machines; Phase detection; Pixel; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 1994. Vol. 3 - Conference C: Signal Processing, Proceedings of the 12th IAPR International Conference on
  • Conference_Location
    Jerusalem
  • Print_ISBN
    0-8186-6275-1
  • Type

    conf

  • DOI
    10.1109/ICPR.1994.577202
  • Filename
    577202