DocumentCode :
3191297
Title :
Can a sequential thinning algorithm be parallelized?
Author :
Acierno, A. D´ ; De Stefano, C. ; Tortorella, F. ; Vento, M.
Author_Institution :
IRSIP, CNR, Naples, Italy
fYear :
1994
fDate :
9-13 Oct 1994
Firstpage :
360
Abstract :
It is commonly presumed that only parallel thinning algorithms can be efficiently implemented on a parallel machine. In this paper it is shown that also a sequential thinning algorithm can have parallel features which can be made explicit and successfully used for a parallel implementation. To this end, the main phases of a fully sequential algorithm are reformulated in such a way that each phase can be carried out by using parallel operators. Experimental results, obtained on a general purpose SIMD machine, are finally discussed
Keywords :
image recognition; general-purpose SIMD machine; parallel thinning algorithms; sequential thinning algorithm; Application software; Computed tomography; Computer architecture; Computer vision; Concurrent computing; Labeling; Parallel machines; Phase detection; Pixel; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 1994. Vol. 3 - Conference C: Signal Processing, Proceedings of the 12th IAPR International Conference on
Conference_Location :
Jerusalem
Print_ISBN :
0-8186-6275-1
Type :
conf
DOI :
10.1109/ICPR.1994.577202
Filename :
577202
Link To Document :
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