Title :
Proposal for BER based specifications for DDR4
Author :
Chaudhuri, Santanu ; McCall, James A. ; Salmon, Joe H.
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
We present a proposal for a statistical approach to DRAM DDR electrical specifications to improve analysis accuracy and specification methods, improving the predictability for the higher DDR4 data rates.
Keywords :
DRAM chips; statistical analysis; BER based specification; DDR4 data rates; DRAM DDR electrical specification; specification method; statistical approach; Noise; Noise measurement; Random access memory; Receivers; Timing; Timing jitter;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2010 IEEE 19th Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-6865-2
Electronic_ISBN :
978-1-4244-6866-9
DOI :
10.1109/EPEPS.2010.5642561