DocumentCode :
3191420
Title :
Using the nonlinear property of FSR and dictionary coding for reduction of test volume
Author :
Lee, Il-Soo ; Jeong, Jae Hoon ; Ambler, Anthony P.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
fYear :
2005
fDate :
11-12 May 2005
Firstpage :
194
Lastpage :
199
Abstract :
Using the nonlinear feedback shift register in testing is known to create a test set for combinational circuits instead of using the deterministic test set. The nonlinear property of feedback shift register is used differently here to reduce the test data volume for combinational circuits without using the nonlinear feedback shift register. In addition, a dictionary coding method is applied to further decrease a reduced test set. Results with benchmark circuits show a great improvement in the reduction of test data volume.
Keywords :
circuit simulation; combinational circuits; integrated circuit testing; shift registers; FSR; benchmark circuits; combinational circuits; deterministic test set; dictionary coding; nonlinear feedback shift register; Bandwidth; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Dictionaries; Feedback; Integrated circuit testing; Power dissipation; Shift registers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI, 2005. Proceedings. IEEE Computer Society Annual Symposium on
Print_ISBN :
0-7695-2365-X
Type :
conf
DOI :
10.1109/ISVLSI.2005.75
Filename :
1430132
Link To Document :
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