DocumentCode
3191420
Title
Using the nonlinear property of FSR and dictionary coding for reduction of test volume
Author
Lee, Il-Soo ; Jeong, Jae Hoon ; Ambler, Anthony P.
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
fYear
2005
fDate
11-12 May 2005
Firstpage
194
Lastpage
199
Abstract
Using the nonlinear feedback shift register in testing is known to create a test set for combinational circuits instead of using the deterministic test set. The nonlinear property of feedback shift register is used differently here to reduce the test data volume for combinational circuits without using the nonlinear feedback shift register. In addition, a dictionary coding method is applied to further decrease a reduced test set. Results with benchmark circuits show a great improvement in the reduction of test data volume.
Keywords
circuit simulation; combinational circuits; integrated circuit testing; shift registers; FSR; benchmark circuits; combinational circuits; deterministic test set; dictionary coding; nonlinear feedback shift register; Bandwidth; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Dictionaries; Feedback; Integrated circuit testing; Power dissipation; Shift registers;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI, 2005. Proceedings. IEEE Computer Society Annual Symposium on
Print_ISBN
0-7695-2365-X
Type
conf
DOI
10.1109/ISVLSI.2005.75
Filename
1430132
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