• DocumentCode
    3191420
  • Title

    Using the nonlinear property of FSR and dictionary coding for reduction of test volume

  • Author

    Lee, Il-Soo ; Jeong, Jae Hoon ; Ambler, Anthony P.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
  • fYear
    2005
  • fDate
    11-12 May 2005
  • Firstpage
    194
  • Lastpage
    199
  • Abstract
    Using the nonlinear feedback shift register in testing is known to create a test set for combinational circuits instead of using the deterministic test set. The nonlinear property of feedback shift register is used differently here to reduce the test data volume for combinational circuits without using the nonlinear feedback shift register. In addition, a dictionary coding method is applied to further decrease a reduced test set. Results with benchmark circuits show a great improvement in the reduction of test data volume.
  • Keywords
    circuit simulation; combinational circuits; integrated circuit testing; shift registers; FSR; benchmark circuits; combinational circuits; deterministic test set; dictionary coding; nonlinear feedback shift register; Bandwidth; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Dictionaries; Feedback; Integrated circuit testing; Power dissipation; Shift registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI, 2005. Proceedings. IEEE Computer Society Annual Symposium on
  • Print_ISBN
    0-7695-2365-X
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2005.75
  • Filename
    1430132