DocumentCode
3191422
Title
Identification of multiple scatter in images
Author
Stach, J.
Author_Institution
SRI Int., Menlo Park, CA, USA
fYear
1992
fDate
18-25 June 1992
Abstract
Summary form only given. The author examined an alternative approach that involves computing a series of conventional images used to identify the location and delay (interaction distance) of regions in the original image that represent multiple scattering. In a typical imaging application, a reference delay is chosen so that all the direct scattering from the target is focused. In anechoic chambers, this is accomplished by a reference target, usually a sphere, that is measured before the target of interest. In an image formed using the reference delay, direct scattering is focused and scattering that arises from interactions is blurred and displaced. However, if the original data are shifted by the time delay over which an interaction takes place, the interaction will be focused and direct scattering will be blurred and displaced in the image. Therefore, a region can be identified as resulting from an interaction if its corresponding peak is formed in a time-shifted image. The spatial location of the peak represents the center of the interaction and the time shift represents the interaction distance. The center and circle corresponding to the location and interaction distance, respectively, can then be overlaid onto the original image to provide insight into the sources of the interaction.<>
Keywords
electromagnetic wave scattering; image processing; anechoic chambers; center; circle; direct scattering; imaging application; interaction distance; interaction sources; multiple scatter identification; peak; reference delay; spatial location; sphere; time delay; time shift; time-shifted image; Anechoic chambers; Delay effects; Flexible printed circuits; Focusing; Scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
Conference_Location
Chicago, IL, USA
Print_ISBN
0-7803-0730-5
Type
conf
DOI
10.1109/APS.1992.221526
Filename
221526
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