DocumentCode :
3191466
Title :
Design of Built in Self Test Asynchronous Micropipeline using Double Edge Triggered D Flip Flop
Author :
Mohideen, S. Kaja ; Perinbam, J. RajaPaul
fYear :
2005
fDate :
11-13 Dec. 2005
Firstpage :
322
Lastpage :
326
Abstract :
Asynchronous micropipeline is a popular design style of building asynchronous circuits. This paper presents the novel idea of implementation of Built in Self Test (BIST) asynchronous micropipeline using Double Edge Triggered D Flip Flop(DETDFF). A two stage, 4 bit asynchronous micro pipeline incorporated with built in self test feature and operating in four modes namely normal mode, testing mode, Linear Feedback Shift register (LFSR) and Signature analyzer(SA) modes have been implemented using DETDFF. We had compared our proposed circuit with BIST asynchronous micropipeline designed using BILBO register by Petlin and Furber. We have implemented both the circuits in CMOS 0.13u and 0.18u Technology using T-spice and compared the performance in terms of power consumption and delay.
Keywords :
Asynchronous micropipeline; BILBO; BIST; DETDFF; Asynchronous circuits; Automatic testing; Buildings; Built-in self-test; CMOS technology; Circuit testing; Delay; Energy consumption; Linear feedback shift registers; Pipelines; Asynchronous micropipeline; BILBO; BIST; DETDFF;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
INDICON, 2005 Annual IEEE
Print_ISBN :
0-7803-9503-4
Type :
conf
DOI :
10.1109/INDCON.2005.1590182
Filename :
1590182
Link To Document :
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