• DocumentCode
    3191573
  • Title

    Analysis of power distribution network in TSV-based 3D-IC

  • Author

    Kim, Kiyeong ; Lee, Woojin ; Kim, Jaemin ; Song, Taigon ; Joohee Kim ; Jun So Pak ; Joungho Kim ; Hyungdong Lee ; Kwon, Yongkee ; Park, Kunwoo

  • Author_Institution
    Dept. of Electr. Eng., KAIST, Daejeon, South Korea
  • fYear
    2010
  • fDate
    25-27 Oct. 2010
  • Firstpage
    177
  • Lastpage
    180
  • Abstract
    To reduce simultaneous switching noise (SSN) in a PDN design of TSV-based GPU system, the impedance properties of the hierarchical PDN in the TSV-based GPU system were estimated and analyzed. The system consisted of triple-stacked TSV-based DRAMs on top of the GPU connected by TSVs, a silicon interposer, and a backside re-distribution layer (BS-RDL). A segmentation-based impedance-estimation method was used for the estimation of the total PDN impedance combining models of the on-chip PDN, the power/ground (P/G) TSV, and the coplanar P/G line in the BS-RDL. The impedance properties of the PDN were also analyzed with respect to variations in the number of P/G TSVs and P/G lines in the BS-RDL and variation of the capacitance of the on-chip decoupling capacitor embedded in the on-chip PDN.
  • Keywords
    DRAM chips; distribution networks; integrated circuit noise; power integrated circuits; switching circuits; three-dimensional integrated circuits; BS-RDL; PDN design; PDN impedance combining models; SSN; TSV-based 3D-IC; TSV-based GPU system; backside redistribution layer; coplanar P/G line; hierarchical PDN; impedance property; onchip PDN; onchip decoupling capacitor; power distribution network analysis; power/ground TSV; segmentation-based impedance-estimation method; silicon interposer; simultaneous switching noise; triple-stacked TSV-based DRAM; Capacitance; Graphics processing unit; Impedance; Inductance; Random access memory; System-on-a-chip; Through-silicon vias; Hierarchical power distribution network (PDN); P/G TSV; coplanar P/G line; on-chip decoupling capacitor; segmentation method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2010 IEEE 19th Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-6865-2
  • Electronic_ISBN
    978-1-4244-6866-9
  • Type

    conf

  • DOI
    10.1109/EPEPS.2010.5642575
  • Filename
    5642575