Title :
Parametric model order reduction from measurements
Author :
Lefteriu, S. ; Antoulas, A.C. ; Ionita, A.C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA
Abstract :
We address the problem of parametric model order reduction given measurements of the response of a device performed with respect to frequency, and also with respect to a design parameter, which could relate to its geometry or material properties. The proposed approach is based on a generalization of the Loewner matrix to the case when data depend on two variables, namely frequency and a design parameter.
Keywords :
geometry; matrix algebra; reduced order systems; Loewner matrix; design parameter; geometry; material properties; parametric model order reduction; Frequency measurement; Integrated circuit modeling; Interpolation; Parametric statistics; Polynomials; Reduced order systems; Transmission line matrix methods;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2010 IEEE 19th Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-6865-2
Electronic_ISBN :
978-1-4244-6866-9
DOI :
10.1109/EPEPS.2010.5642579
