• DocumentCode
    3191634
  • Title

    Parametric model order reduction from measurements

  • Author

    Lefteriu, S. ; Antoulas, A.C. ; Ionita, A.C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA
  • fYear
    2010
  • fDate
    25-27 Oct. 2010
  • Firstpage
    193
  • Lastpage
    196
  • Abstract
    We address the problem of parametric model order reduction given measurements of the response of a device performed with respect to frequency, and also with respect to a design parameter, which could relate to its geometry or material properties. The proposed approach is based on a generalization of the Loewner matrix to the case when data depend on two variables, namely frequency and a design parameter.
  • Keywords
    geometry; matrix algebra; reduced order systems; Loewner matrix; design parameter; geometry; material properties; parametric model order reduction; Frequency measurement; Integrated circuit modeling; Interpolation; Parametric statistics; Polynomials; Reduced order systems; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2010 IEEE 19th Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-6865-2
  • Electronic_ISBN
    978-1-4244-6866-9
  • Type

    conf

  • DOI
    10.1109/EPEPS.2010.5642579
  • Filename
    5642579
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3191634