DocumentCode :
3191652
Title :
Minimizing Offset for Latching Voltage-Mode Sense Amplifiers for Sub-Threshold Operation
Author :
Ryan, Joseph F. ; Calhoun, Benton H.
Author_Institution :
Univ. of Virginia, Charlottesville
fYear :
2008
fDate :
17-19 March 2008
Firstpage :
127
Lastpage :
132
Abstract :
This paper examines latch style voltage mode sense amplifiers for operation in the sub-threshold region, where VDD<VT. We show that the offset gets worse relative to strong inversion as technology scales. Furthermore, increasing the sizes of devices in the sense amplifier does not yield the reduction of input referred offset according to 1/(WL)0.5 that is achieved for strong inversion operation. We analyze the source of the offset and propose circuit level operating principles for minimizing its impact in subthreshold SAs. This design methodology will optimize sub- VT SAs for more robust ultra low power operation.
Keywords :
amplifiers; flip-flops; latching voltage-mode amplifiers; offset minimizing; sense amplifiers; Design methodology; Design optimization; Digital circuits; Energy resolution; Latches; Operational amplifiers; Random access memory; Robustness; Threshold voltage; Topology; Offset; Sense-Amplifiers; Sub-Vt; Sub-threshold Circuits; Variation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-0-7695-3117-5
Type :
conf
DOI :
10.1109/ISQED.2008.4479712
Filename :
4479712
Link To Document :
بازگشت