DocumentCode :
3191677
Title :
Multistress aging of machine insulation systems
Author :
Kimura, Ken
Author_Institution :
Central Res. Lab., Mitsubishi Electr. Corp., Amagasaki, Japan
fYear :
1995
fDate :
22-25 Oct 1995
Firstpage :
205
Lastpage :
210
Abstract :
Insulation systems of electrical machines are exposed to electrical, thermal, mechanical and environmental stresses during service operation. After a brief survey of aging evaluation, general treatment on multistress aging is discussed. The concept and result of cumulative multistress aging model is reviewed. Experimental setup for multistress aging and some results are presented. Based on SEM pictures of aged insulation, the development of microscopic defects is discussed as one of key phenomena in solid composite materials during aging
Keywords :
ageing; composite insulating materials; insulation testing; life testing; machine insulation; scanning electron microscopy; thermal stresses; SEM pictures; aging model; electrical stresses; environmental stresses; machine insulation systems; mechanical stresses; microscopic defects; multistress aging; service operation; solid composite materials; thermal stresses; Aging; Conducting materials; Dielectrics and electrical insulation; Electric breakdown; IEC standards; Partial discharges; Scanning electron microscopy; Thermal stresses; Vibrations; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1995. Annual Report., Conference on
Conference_Location :
Virginia Beach, VA
Print_ISBN :
0-7803-2931-7
Type :
conf
DOI :
10.1109/CEIDP.1995.483611
Filename :
483611
Link To Document :
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