• DocumentCode
    3191677
  • Title

    Multistress aging of machine insulation systems

  • Author

    Kimura, Ken

  • Author_Institution
    Central Res. Lab., Mitsubishi Electr. Corp., Amagasaki, Japan
  • fYear
    1995
  • fDate
    22-25 Oct 1995
  • Firstpage
    205
  • Lastpage
    210
  • Abstract
    Insulation systems of electrical machines are exposed to electrical, thermal, mechanical and environmental stresses during service operation. After a brief survey of aging evaluation, general treatment on multistress aging is discussed. The concept and result of cumulative multistress aging model is reviewed. Experimental setup for multistress aging and some results are presented. Based on SEM pictures of aged insulation, the development of microscopic defects is discussed as one of key phenomena in solid composite materials during aging
  • Keywords
    ageing; composite insulating materials; insulation testing; life testing; machine insulation; scanning electron microscopy; thermal stresses; SEM pictures; aging model; electrical stresses; environmental stresses; machine insulation systems; mechanical stresses; microscopic defects; multistress aging; service operation; solid composite materials; thermal stresses; Aging; Conducting materials; Dielectrics and electrical insulation; Electric breakdown; IEC standards; Partial discharges; Scanning electron microscopy; Thermal stresses; Vibrations; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1995. Annual Report., Conference on
  • Conference_Location
    Virginia Beach, VA
  • Print_ISBN
    0-7803-2931-7
  • Type

    conf

  • DOI
    10.1109/CEIDP.1995.483611
  • Filename
    483611