DocumentCode
3191709
Title
Reduction of power and test time by removing cluster of don´t-care from test data set
Author
Lee, Il-Soo ; Lin, Yu-Ting ; Ambler, Anthony P.
fYear
2005
fDate
11-12 May 2005
Firstpage
255
Lastpage
256
Abstract
Reduction of power dissipation and test time is accomplished by forming two clusters of don´t-care inside an input and a response test cube, respectively. These clusters are out of the scan operation.
Keywords
circuit simulation; integrated circuit testing; logic partitioning; logic testing; IC testing; power dissipation; response test cube; scan operation; test data set; test time; Circuit testing; Clocks; Data engineering; Integrated circuit testing; Latches; Power dissipation; Power engineering and energy; Power engineering computing; Shape; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI, 2005. Proceedings. IEEE Computer Society Annual Symposium on
Print_ISBN
0-7695-2365-X
Type
conf
DOI
10.1109/ISVLSI.2005.63
Filename
1430144
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