Title :
Reduction of power and test time by removing cluster of don´t-care from test data set
Author :
Lee, Il-Soo ; Lin, Yu-Ting ; Ambler, Anthony P.
Abstract :
Reduction of power dissipation and test time is accomplished by forming two clusters of don´t-care inside an input and a response test cube, respectively. These clusters are out of the scan operation.
Keywords :
circuit simulation; integrated circuit testing; logic partitioning; logic testing; IC testing; power dissipation; response test cube; scan operation; test data set; test time; Circuit testing; Clocks; Data engineering; Integrated circuit testing; Latches; Power dissipation; Power engineering and energy; Power engineering computing; Shape; Very large scale integration;
Conference_Titel :
VLSI, 2005. Proceedings. IEEE Computer Society Annual Symposium on
Print_ISBN :
0-7695-2365-X
DOI :
10.1109/ISVLSI.2005.63
