Time-domain field responses of the thin, high-contrast, finely layered structure in IC packagings

The thin, high-contrast, fine layers with dielectric and conductive properties, such as ground planes, are feature structures in IC packagings. Their responses to the pulsed electromagnetic field is important both theoretically and practically. In this paper, a new semi-analytical method is proposed to model the interaction of the layer with an incident electromagnetic field via a boundary condition that expresses the in-plane conduction and contrast electric polarization currents in terms of the exciting incident field by relating the jump in the tangential component of the magnetic field strength across the layer in terms of the (continuous) tangential component of the electric field strength in the layer. Expressions for pulse shapes of the reflected and transmitted fields are conveniently obtained based on this method. It provides a novel angle to investigate the ground plane effects inside IC packagings.