Title :
FDTD analysis of resonance characteristics of microstrip antennas
Author :
Wai-Lee Ko ; Mittra, R.
Author_Institution :
Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
Abstract :
The authors investigate the application of the finite-difference time-domain (FDTD) technique to the analysis of the resonance characteristics of patch antennas. A time-domain technique based on Yee´s (see IEEE Trans. Antennas Propag., vol.AP-39, no.3, p.410, 1991) cell and the second-order Mur absorbing walls is used in the computation of both far-field and near-field characteristics of integrated antennas with multiple patches sandwiched between layers of dielectric with finite ground plane. Feed lines are modeled as an integral part of the radiating structure so that input impedance can be computed as S-parameters of a one-port for a singly fed stacked patch and of a two-port network for doubly fed stacked patches. To establish the accuracy of the FDTD results, the radar cross-section characteristics of various patch antennas, with or without cavity backing, have been computed and the results compared with the published data obtained by other computational techniques or measurements.<>
Keywords :
antenna radiation patterns; finite difference time-domain analysis; microstrip antennas; resonance; FDTD; S-parameters; Yee cell; cavity backing; dielectric; doubly fed stacked patches; far-field; feed lines; finite ground plane; finite-difference time-domain; input impedance; integrated antennas; microstrip antennas; near-field; one-port; patch antennas; radar cross-section characteristics; radiating structure; resonance characteristics; second-order Mur absorbing walls; singly fed stacked patch; two-port network; Computer networks; Dielectrics; Feeds; Finite difference methods; Impedance; Microstrip antennas; Patch antennas; Radar cross section; Resonance; Time domain analysis;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-0730-5
DOI :
10.1109/APS.1992.221546
