Title :
Broadband material characterization using microstrip/stripline field applicator
Author :
Grimm, J.M. ; Nyquist, D.P. ; Thorland, M. ; Infante, D.
Author_Institution :
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
A flexible field applicator for electromagnetic material parameter measurements using an automated network analyzer has been designed, operable in either stripline or microstrip mode. An effective de-embedding scheme has been used to extract the sample region scattering parameters from the measured terminal scattering parameters. The sample scattering parameters are processed to determine the phase constant and the characteristic impedance of the sample-loaded transmission region, from which the constructive parameters of the material are then determined, based upon the configuration.<>
Keywords :
S-parameters; automatic test equipment; materials testing; microstrip components; microwave measurement; network analysers; strip line components; automated network analyzer; broadband material; characteristic impedance; electromagnetic material; microstrip/stripline field applicator; parameter measurements; phase constant; sample region scattering parameters; sample-loaded transmission region; terminal scattering parameters; Applicators; Conducting materials; Dielectric measurements; Impedance; Magnetic field measurement; Microstrip; Reflection; Scattering parameters; Stripline; Strips;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1992. AP-S. 1992 Digest. Held in Conjuction with: URSI Radio Science Meeting and Nuclear EMP Meeting., IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-0730-5
DOI :
10.1109/APS.1992.221550
