Title :
Study of Voltage Regulator noise characterization, coupling scheme and simulation method
Author :
Mao, Wenjie ; He, Jiangqi ; Standford, Edward ; Li, YL
Author_Institution :
Data Center Group, EPSD, Intel Asia-Pacific R&D Ltd., Shanghai, China
Abstract :
Signal Integrity (SI) and Power Integrity (PI) issues caused by on-board Voltage Regulator (VR) interfering always leads to system reliability problem. Prediction of this VR noise is very difficult due to its complexity. This paper addresses a two-step simulation method associated with this issue by identifying radiation source and coupling path. A typical PCB routing is studied and result is correlated with measurement.
Keywords :
circuit noise; circuit simulation; network routing; printed circuit design; voltage regulators; PCB routing; coupling scheme; on board voltage regulator; power integrity; signal integrity; simulation method; system reliability; voltage regulator noise characterization; Couplings; Electromagnetic interference; FETs; Mathematical model; Noise; Noise measurement; Synchronization; EMI/RFI Simulation; Power Integrity; Signal Integrity; Voltage Regulator Noise;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2010 IEEE 19th Conference on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-6865-2
Electronic_ISBN :
978-1-4244-6866-9
DOI :
10.1109/EPEPS.2010.5642599
