Timing-Aware Multiple-Delay-Fault Diagnosis

With feature sizes steadily shrinking, manufacturing defects and parameter variations often cause design timing failures. It is essential that these errors be correctly and quickly diagnosed. In this paper, we analyze the multiple-delay fault diagnosis problem and propose a novel, simulation-based approach to solve it. We enhance the diagnostic resolution by processing failure logs at various slower- than-nominal clock frequencies. We experimentally determined our diagnosis algorithm s sensitivity to delay variations.