DocumentCode :
3192080
Title :
A highly linear wide dynamic range detector for cell recording with microelectrode arrays
Author :
Guo, Jing ; Liu, Bing ; Yuan, Jie
Author_Institution :
Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
fYear :
2010
fDate :
27-29 Sept. 2010
Firstpage :
179
Lastpage :
182
Abstract :
Microelectrode arrays (MEA) are widely used to record extracellular action potential (AP) and local field potential (LFP) in electro-psychological studies. Conventional MEA detectors have low linearity (1%) and limited dynamic range (DR<;;70dB). New immunological applications such as mast cell recoding require higher linearity and wider DR. In this paper, we introduce a new MEA detector architecture with a continuous-time (CT) front-end and a discrete-time (DT) backend to achieve high linearity. We also use chopping and antialiasing RC filter to reduce the noise in the CT front-end and the DT back-end respectively so as to achieve wide DR. The new detector is implemented in a 0.35μm CMOS process. SPICE simulation shows that it achieves 0.07% linearity for 20mVpp input signal and 0.6μVrms input-referred noise over 1-200Hz for the LFP signal which results in 81.4dB DR. It can also record the AP signal with 66dB DR. The power consumption is 66.5μW from a 3.3V supply.
Keywords :
CMOS integrated circuits; bioelectric potentials; biomedical electrodes; cellular biophysics; microelectrodes; CMOS process; MEA detector architecture; SPICE simulation; antialiasing RC filter; cell recording; chopping; continuous-time front-end; discrete-time backend; electro-psychological studies; extracellular action potential; frequency 1 Hz to 200 Hz; immunological applications; input-referred noise; linear wide dynamic range detector; local field potential; microelectrode arrays; power 66.5 muW; size 0.35 mum; voltage 3.3 V; 1f noise; Computer architecture; Detectors; Gain; Linearity; Resistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI System on Chip Conference (VLSI-SoC), 2010 18th IEEE/IFIP
Conference_Location :
Madrid
Print_ISBN :
978-1-4244-6469-2
Type :
conf
DOI :
10.1109/VLSISOC.2010.5642601
Filename :
5642601
Link To Document :
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