Title :
An SSO Based Methodology for EM Emission Estimation from SoCs
Author :
Jairam, S. ; Stalin, S.M. ; Oberle, Jean-Yves ; Udayakumar, H.
Author_Institution :
Texas Instrum., Dallas
Abstract :
A methodology to estimate electromagnetic (EM) emission from SoCs is presented. The solution works on estimating current spectral components at the SoC periphery by performing power integrity analysis based on simultaneously switching outputs (SSO). These components are then converted to electric and magnetic dipoles. The dipoles are then analysed by a customised field solver, which computes, the field radiation patterns. Antenna models have been generated through the lead frames for quad flat and ball grid array packages. The proposed approach enables unification of SoC periphery analysis platform for timing, signal, power integrity alongwith EM emission estimation. Finally the approach has been demonstrated on various SoC periphery analysis scenarios. A memory interface of a 90 nm SOC design has been analysed and results have been compared with silicon measurements.
Keywords :
antenna radiation patterns; electromagnetic compatibility; integrated circuit design; system-on-chip; SoC; antenna models; ball grid array packages; electric dipoles; electromagnetic emission; field radiation patterns; field solver; lead frames; magnetic dipoles; power integrity analysis; quad flat packages; simultaneously switching outputs; size 90 nm; system-on-chip; Antenna radiation patterns; Dipole antennas; Electronics packaging; Magnetic analysis; Mesh generation; Pattern analysis; Performance analysis; Signal analysis; Silicon; Timing;
Conference_Titel :
Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-0-7695-3117-5
DOI :
10.1109/ISQED.2008.4479743