• DocumentCode
    3192247
  • Title

    An SSO Based Methodology for EM Emission Estimation from SoCs

  • Author

    Jairam, S. ; Stalin, S.M. ; Oberle, Jean-Yves ; Udayakumar, H.

  • Author_Institution
    Texas Instrum., Dallas
  • fYear
    2008
  • fDate
    17-19 March 2008
  • Firstpage
    297
  • Lastpage
    300
  • Abstract
    A methodology to estimate electromagnetic (EM) emission from SoCs is presented. The solution works on estimating current spectral components at the SoC periphery by performing power integrity analysis based on simultaneously switching outputs (SSO). These components are then converted to electric and magnetic dipoles. The dipoles are then analysed by a customised field solver, which computes, the field radiation patterns. Antenna models have been generated through the lead frames for quad flat and ball grid array packages. The proposed approach enables unification of SoC periphery analysis platform for timing, signal, power integrity alongwith EM emission estimation. Finally the approach has been demonstrated on various SoC periphery analysis scenarios. A memory interface of a 90 nm SOC design has been analysed and results have been compared with silicon measurements.
  • Keywords
    antenna radiation patterns; electromagnetic compatibility; integrated circuit design; system-on-chip; SoC; antenna models; ball grid array packages; electric dipoles; electromagnetic emission; field radiation patterns; field solver; lead frames; magnetic dipoles; power integrity analysis; quad flat packages; simultaneously switching outputs; size 90 nm; system-on-chip; Antenna radiation patterns; Dipole antennas; Electronics packaging; Magnetic analysis; Mesh generation; Pattern analysis; Performance analysis; Signal analysis; Silicon; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-0-7695-3117-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2008.4479743
  • Filename
    4479743