DocumentCode :
3192366
Title :
Parasitic Aware Process Variation Tolerant Voltage Controlled Oscillator (VCO) Design
Author :
Ghai, Dhruva ; Mohanty, Saraju P. ; Kougianos, Elias
Author_Institution :
Univ. of North Texas, Denton
fYear :
2008
fDate :
17-19 March 2008
Firstpage :
330
Lastpage :
333
Abstract :
In this paper we present a parasitic aware, process variation tolerant optimization methodology that may be applied to nanoscale circuits to ensure better yield. A current- starved voltage controlled oscillator (VCO) is treated as a case study and to the best of the authors´ knowledge, this is the first VCO design that accounts for both parasitic degradation and process variation together. The physical design of the VCO is carried out in a generic 90 nm Salicide 1.2V/2.5V 1 Poly 9 Metal process design kit. The oscillation frequency is the objective function with the area overhead as constraint. A performance degradation of 43.5% is observed when the parasitic extracted circuit was subjected to worst case process variation. After a single physical design iteration, the frequency of oscillation was within 4.5% of the target.
Keywords :
CMOS integrated circuits; integrated circuit design; integrated circuit yield; iterative methods; nanoelectronics; optimisation; radiofrequency integrated circuits; radiofrequency oscillators; voltage-controlled oscillators; Salicide 1 Poly 9 Metal process design kit; VCO design; nanoscale CMOS RF circuit yield; parasitic aware process variation tolerant optimization; physical design iteration; size 90 nm; voltage controlled oscillator; CMOS technology; Degradation; Design optimization; Inductors; Integrated circuit interconnections; Phase noise; Process design; Radio frequency; Timing; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-0-7695-3117-5
Type :
conf
DOI :
10.1109/ISQED.2008.4479750
Filename :
4479750
Link To Document :
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