Reduction of process variation effect on FPGAs using multiple configurations

In recent years, parameter variations present critical challenges for manufacturability and yield on integrated circuits. In this paper, a new method for improving the timing yield of field programmable gate array (FPGA) devices affected by random and systematic within-die variation is proposed. By selection of an appropriate configuration from a set of functionally equivalent configurations average critical path delay is reduced under conditions of large random and systematic variation considering spatial correlation. Compared to the previous approach which is limited to a fixed placement, our method improves timing yield by attempting several placements and routings without lengthy placement and routing phases to handle systematic variations and spatial correlation. The average critical path delay is reduced by 7% compared to the previous work over 20 MCNC benchmarks.