Title :
Statistical Variation Of FEL Performance Due To Wiggler Field Errors
Author :
Kennedy, P. ; Bobbs, B. ; Rakowsky, G. ; Cover, R.
Author_Institution :
Rockwell International
fDate :
28 Aug- 1 Sep 1989
Keywords :
Brightness; Electron emission; Equations; Frequency; Information analysis; Numerical simulation; Performance analysis; Performance gain; Spontaneous emission; Undulators;
Conference_Titel :
Free Electron Laser Conference, 1989. Proceedings of the Eleventh International
DOI :
10.1109/FEL.1989.716076