DocumentCode :
3192692
Title :
A Fully-Integrated 2.4 GHz  Mismatch-Controllable RF Front-end Test Platform in 0.18µm CMOS
Author :
Ebadi, Zahra Sadat ; Saleh, Resve
Author_Institution :
Univ. of British Columbia, Vancouver
fYear :
2008
fDate :
17-19 March 2008
Firstpage :
411
Lastpage :
416
Abstract :
The design and implementation of a prototype testbench for a direct conversion receiver RF front-end targeted for the 2.4 GHz ISM band are described. The developed front-end provides user control of I/Q mismatch and is intended as a test vehicle for evaluation of various I/Q mismatch compensation methods implemented in the back-end. The I and Q path mixers can operate in normal mode, or they can be controlled externally to introduce a known mismatch, or controlled to compensate for the actual mismatch, which results in a dramatic increase in the image rejection ratio (IRR). A prototype of the proposed circuit was fabricated using TSMC 0.18 mum CMOS technology and includes a low noise amplifier (LNA), two mixers (with quadrature down-conversion) and a quadrature voltage-controlled oscillator (QVCO). It achieves a conversion gain of 40 dB, and a noise figure of 9.8 dB. The circuit dissipates 25 mW and occupies an active area of 2.5 mm2.
Keywords :
CMOS integrated circuits; UHF amplifiers; UHF integrated circuits; UHF mixers; UHF oscillators; low noise amplifiers; receivers; voltage-controlled oscillators; CMOS technology; I/Q mismatch compensation; RF front-end test platform; UHF amplifiers; UHF mixers; UHF oscillators; direct conversion receiver; frequency 2.4 GHz; gain 40 dB; image rejection ratio; low noise amplifier; noise figure 9.8 dB; power 25 mW; quadrature voltage-controlled oscillator; size 0.18 mum; CMOS technology; Circuit noise; Gain; Image converters; Low-noise amplifiers; Prototypes; Radio frequency; Testing; Vehicles; Voltage-controlled oscillators; Direct conversion receiver; IEEE 802.11g; IQ mismatch; Mismatch-Controllable; RF front-end;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
978-0-7695-3117-5
Type :
conf
DOI :
10.1109/ISQED.2008.4479767
Filename :
4479767
Link To Document :
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