• DocumentCode
    3192704
  • Title

    A Holistic Approach to SoC Verification

  • Author

    Strang, Alicia ; Potts, David ; Hemmady, Shankar

  • Author_Institution
    Marvell Semicond., Sunnyvale
  • fYear
    2008
  • fDate
    17-19 March 2008
  • Firstpage
    417
  • Lastpage
    422
  • Abstract
    Semiconductor designs are continuously growing in complexity. It is no longer practical to view large swaths of waveforms at one time. Dataflow and bus transactions must be presented to engineers in way that will stimulate their creative juices and empower an intuitive understanding of the big picture without unnecessarily cluttering the debug environment. Over time, as technologies enable advanced viewing, navigating and packetizing the waveforms, we migrate to a more artistic approach for understanding complex semiconductor systems. Test environments are bound to grow more complex. Intuitive, visual presentations will support a holistic approach for comprehending and systematically working with increasing complexity instead of getting buried deep into unnecessary details - a need-to-know basis description of the underlying design details. This paper scratches the surface on what such holistic verification solutions will look like by citing examples from existing commercial EDA technologies as well as in- house home-brewed solutions. Examples include design visualization environments that employ hierarchy of signals, color-coding, advanced packet bundling and exploding packet views to foster right-brained thought. Potential future improvements to EDA tools are suggested to show how transaction level models and verification sessions can be presented to give an intuitive feel of the SoC design.
  • Keywords
    electronic design automation; formal verification; system-on-chip; EDA technologies; SoC design; SoC verification; electronic design automation; holistic verification solutions; transaction level models; Data engineering; Debugging; Electronic design automation and methodology; Humans; Navigation; Object oriented modeling; Shape; Signal design; Testing; Visualization; SoC; debug; holistic verification; right-brained thinking; verification; verification management; visualization environments;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2008. ISQED 2008. 9th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-0-7695-3117-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2008.4479768
  • Filename
    4479768